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Surface Microscopy with Low Energy Electrons

Lingua IngleseInglese
Libro Rigido
Libro Surface Microscopy with Low Energy Electrons Ernst Bauer
Codice Libristo: 02581282
Casa editrice Springer-Verlag New York Inc., luglio 2014
This book, written by a pioneer in surface physics and thin film research and the inventor of Low En... Descrizione completa
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This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations will illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.§

Informazioni sul libro

Titolo completo Surface Microscopy with Low Energy Electrons
Autore Ernst Bauer
Lingua Inglese
Rilegatura Libro - Rigido
Data di pubblicazione 2014
Numero di pagine 496
EAN 9781493909346
ISBN 1493909347
Codice Libristo 02581282
Peso 938
Dimensioni 163 x 243 x 24
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