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Materials Characterization - Introduction to Microscopic and Spectroscopic Methods 2e

Lingua IngleseInglese
Libro Rigido
Libro Materials Characterization - Introduction to Microscopic and Spectroscopic Methods 2e Yang Leng
Codice Libristo: 02107894
Casa editrice Wiley-VCH Verlag GmbH, settembre 2013
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two... Descrizione completa
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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students.§The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content.§The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis.§The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text that never loses sight of its intended audience.

Informazioni sul libro

Titolo completo Materials Characterization - Introduction to Microscopic and Spectroscopic Methods 2e
Autore Yang Leng
Lingua Inglese
Rilegatura Libro - Rigido
Data di pubblicazione 2013
Numero di pagine 392
EAN 9783527334636
ISBN 3527334637
Codice Libristo 02107894
Casa editrice Wiley-VCH Verlag GmbH
Peso 904
Dimensioni 252 x 178 x 25
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