Spedizione gratuita con Packeta per un prezzo superiore a 79.99 €
BRT 7.99 Punto BRT 7.99 DHL 7.99 HR Parcel 7.49 GLS 3.99

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Lingua IngleseInglese
Libro Rigido
Libro Advanced Scanning Electron Microscopy and X-Ray Microanalysis Patrick Echlin
Codice Libristo: 01376744
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray... Descrizione completa
? points 508 b
214.93
50% di possibilità Cercheremo nel mondo Quando riceverò il libro?

30 giorni per il reso


Potrebbe interessarti anche


Medieval Clothing and Textiles Robin Netherton / Rigido
common.buy 128.33
Der Schatz von Atlantis Gabriele Beyerlein / In brossura
common.buy 11.55
Effective Mathematics of the Uncountable Noam Greenberg / Rigido
common.buy 129.08
Applied Stress Analysis T.H. Hyde / Rigido
common.buy 154.02
Der narrative Ansatz in der politischen Bildung. Ingo Juchler / In brossura
common.buy 18.83
Rolling Home Alan Bennett / In brossura
common.buy 17.12

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

Informazioni sul libro

Titolo completo Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Lingua Inglese
Rilegatura Libro - Rigido
Numero di pagine 454
EAN 9780306421402
ISBN 0306421402
Codice Libristo 01376744
Peso 1880
Dimensioni 156 x 234
Regala questo libro oggi stesso
È facile
1 Aggiungi il libro al carrello e scegli la consegna come regalo 2 Ti invieremo subito il buono 3 Il libro arriverà all'indirizzo del destinatario

Accesso

Accedi al tuo account. Non hai ancora un account Libristo? Crealo ora!

 
obbligatorio
obbligatorio

Non hai un account? Ottieni i vantaggi di un account Libristo!

Con un account Libristo, avrai tutto sotto controllo.

Crea un account Libristo